- •Contents
- •List of Tables
- •List of Figures
- •Preface
- •About this document
- •Feedback
- •Introduction
- •1.1 About the ARM PrimeCell MultiPort Memory Controller (PL172)
- •1.2 Supported dynamic memory devices
- •1.3 Supported static memory devices
- •Functional Overview
- •2.1 PrimeCell MPMC functional description
- •2.2 Overview of a PrimeCell MPMC, ASIC, or ASSP system
- •2.3 Low power operation
- •2.4 Lock and semaphores
- •2.5 Arbitration
- •2.6 Memory bank select
- •2.7 Memory map
- •Programmer’s Model
- •3.1 About the programmer’s model
- •3.2 Register descriptions
- •Programmer’s Model for Test
- •4.1 PrimeCell MPMC test harness overview
- •4.2 Scan testing
- •4.3 Test registers
- •Static Memory Controller
- •5.1 Static memory device selection
- •5.2 Write-protection
- •5.3 Extended wait transfers
- •5.4 Memory mapped peripherals
- •5.5 Static memory initialization
- •5.6 Byte lane control
- •5.7 Byte lane control and databus steering for little and big-endian configurations
- •Dynamic Memory Controller
- •6.1 Write-protection
- •6.2 Access sequencing and memory width
- •6.3 Address mapping
- •6.4 Dynamic memory controller command descriptions
- •6.5 Generic SDRAM initialization example
- •6.6 Micron MT48LC4M16A2 SDRAM initialization example
- •6.8 Micron MT28F4M16S2 SyncFlash initialization example
- •6.9 Micron SyncFlash commands
- •Common Memory Transactions
- •7.1 Static and dynamic memory transaction latency
- •Test Interface Controller
- •8.1 About TIC
- •8.2 Sequence of events leading to entry into TIC test mode
- •System Connectivity
- •9.2 Self-refresh entry
- •9.3 Example system
- •Off-chip Connectivity
- •10.2 Pin count reduction by reducing databus width
- •10.3 Pin count reduction by removing functionality
- •10.4 Address pin reduction
- •10.5 Chip select pin reduction
- •10.6 Device support
- •10.7 Multiplexing static and dynamic memory pins
- •10.8 Reducing pin count by multiplexing MPMC pins
- •10.9 About MPMC timing
- •10.10 On-chip timing path
- •10.11 Off-chip timing path
- •10.12 Clock strategy
- •10.13 Clock ratios
- •10.14 Memory clock and fed-back clock strategy
- •Pad Interface Timing
- •A.1 Overview
- •A.2 Signal delay
- •A.3 Method to reduce delay
- •A.4 Methods to reduce skew
- •A.5 Methods to minimize the effects of delay and skew
- •A.6 Example SDRAM memory timing diagram
- •A.7 SDRAM memory timing paths
- •Troubleshooting
- •B.1 Troubleshooting
- •C.1 AHB register signals
- •C.2 AHB memory signals
- •C.3 Miscellaneous and clock signals
- •C.4 Pad interface and control signals
- •C.5 Test Interface Controller (TIC) signals
- •C.6 Scan test signals
Preface
This preface introduces the ARM PrimeCell MultiPort Memory Controller (PL172) and its reference documentation. It contains the following sections:
•About this document on page xiv
•Feedback on page xviii.
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Preface
About this document
This document is a technical reference manual for the ARM PrimeCell MultiPort
Memory Controller (PL172).
Intended audience
This document has been written for hardware and software engineers implementing System-on-Chip (SOC) designs. It provides information to enable designers to integrate the peripheral into a target system as quickly as possible.
Using this manual
This document is organized into the following chapters:
Chapter 1 Introduction
Read this chapter for an introduction to the ARM PrimeCell MultiPort Memory Controller (PL172).
Chapter 2 Functional Overview
Read this chapter for a description of the major functional blocks of the PrimeCell MultiPort Memory Controller (PL172).
Chapter 3 Programmer’s Model
Read this chapter for a description of the PrimeCell MultiPort Memory Controller (PL172) registers and programming details.
Chapter 4 Programmer’s Model for Test
Read this chapter for an description of the logic in the PrimeCell MultiPort Memory Controller (PL172) for functional verification and production testing.
Chapter 5 Static Memory Controller
Read this chapter for details of the Static Memory Controller.
Chapter 6 Dynamic Memory Controller
Read this chapter for details of the Dynamic Memory Controller.
Chapter 7 Common Memory Transactions
Read this chapter for a description of transactions for both dynamic and static memory accesses.
Chapter 8 Test Interface Controller
Read this chapter for details of the Test Interface Controller.
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Preface
Chapter 9 System Connectivity
Read this chapter for details of the system connectivity of the PrimeCell MultiPort Memory Controller (PL172).
Chapter 10 Off-chip Connectivity
Read this chapter for details of the off-chip connectivity of the PrimeCell MultiPort Memory Controller (PL172).
Appendix A Pad Interface Timing
Read this appendix for descriptions of the PrimeCell MultiPort Memory Controller (PL172) signals.
Appendix B Troubleshooting
Read this appendix for descriptions of typical problems and their suggested remedies.
Appendix C MultiPort Memory Controller Signal Descriptions
Read this appendix for descriptions of the signals that interface with the PrimeCell MultiPort Memory Controller (PL172).
Typographical conventions
The following typographical conventions are used in this document:
bold |
Highlights ARM processor signal names, and interface elements |
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such as menu names. Also used for terms in descriptive lists, |
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where appropriate. |
italic |
Highlights special terminology, cross-references, and citations. |
monospace |
Denotes text that can be entered at the keyboard, such as |
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commands, file names and program names, and source code. |
monospace |
Denotes a permitted abbreviation for a command or option. The |
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underlined text can be entered instead of the full command or |
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option name. |
monospace italic |
Denotes arguments to commands or functions where the argument |
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is to be replaced by a specific value. |
monospace bold |
Denotes language keywords when used outside example code. |
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Preface
Timing diagram conventions
This manual contains one or more timing diagrams. The figure below explains the components used in these diagrams. Any variations are clearly labeled when they occur. Therefore, no additional meaning must be attached unless specifically stated.
Clock
HIGH to LOW
Transient
HIGH/LOW to HIGH
Bus stable
Bus to high impedance
Bus change
High impedance to stable bus
Key to timing diagram conventions
Shaded bus and signal areas are undefined, so the bus or signal can assume any value within the shaded area at that time. The actual level is unimportant and does not affect normal operation.
Further reading
This section lists publications by ARM Limited.
ARM periodically provides updates and corrections to its documentation. See
http://www.arm.com for current errata sheets and addenda.
See also the ARM Frequently Asked Questions list at:
http://www.arm.com/DevSupp/Sales+Support/faq.html
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Preface
ARM publications
This document contains information that is specific to the ARM PrimeCell MultiPort Memory Controller (PL172). Refer to the following documents for other relevant information:
•AMBA Specification (Rev 2.0) (ARM IHI 0011)
•ARM PrimeCell MultiPort Memory Controller (PL172) Design Manual (PL172 DDES 0000)
•ARM PrimeCell MultiPort Memory Controller (PL172) Integration Manual
(PL172 INTM 0000)
•AHB Example AMBA System Technical Reference Manual (ARM DDI 0170).
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