- •Contents
- •List of Tables
- •List of Figures
- •Preface
- •About this document
- •Feedback
- •Introduction
- •1.1 About the ARM PrimeCell MultiPort Memory Controller (PL172)
- •1.2 Supported dynamic memory devices
- •1.3 Supported static memory devices
- •Functional Overview
- •2.1 PrimeCell MPMC functional description
- •2.2 Overview of a PrimeCell MPMC, ASIC, or ASSP system
- •2.3 Low power operation
- •2.4 Lock and semaphores
- •2.5 Arbitration
- •2.6 Memory bank select
- •2.7 Memory map
- •Programmer’s Model
- •3.1 About the programmer’s model
- •3.2 Register descriptions
- •Programmer’s Model for Test
- •4.1 PrimeCell MPMC test harness overview
- •4.2 Scan testing
- •4.3 Test registers
- •Static Memory Controller
- •5.1 Static memory device selection
- •5.2 Write-protection
- •5.3 Extended wait transfers
- •5.4 Memory mapped peripherals
- •5.5 Static memory initialization
- •5.6 Byte lane control
- •5.7 Byte lane control and databus steering for little and big-endian configurations
- •Dynamic Memory Controller
- •6.1 Write-protection
- •6.2 Access sequencing and memory width
- •6.3 Address mapping
- •6.4 Dynamic memory controller command descriptions
- •6.5 Generic SDRAM initialization example
- •6.6 Micron MT48LC4M16A2 SDRAM initialization example
- •6.8 Micron MT28F4M16S2 SyncFlash initialization example
- •6.9 Micron SyncFlash commands
- •Common Memory Transactions
- •7.1 Static and dynamic memory transaction latency
- •Test Interface Controller
- •8.1 About TIC
- •8.2 Sequence of events leading to entry into TIC test mode
- •System Connectivity
- •9.2 Self-refresh entry
- •9.3 Example system
- •Off-chip Connectivity
- •10.2 Pin count reduction by reducing databus width
- •10.3 Pin count reduction by removing functionality
- •10.4 Address pin reduction
- •10.5 Chip select pin reduction
- •10.6 Device support
- •10.7 Multiplexing static and dynamic memory pins
- •10.8 Reducing pin count by multiplexing MPMC pins
- •10.9 About MPMC timing
- •10.10 On-chip timing path
- •10.11 Off-chip timing path
- •10.12 Clock strategy
- •10.13 Clock ratios
- •10.14 Memory clock and fed-back clock strategy
- •Pad Interface Timing
- •A.1 Overview
- •A.2 Signal delay
- •A.3 Method to reduce delay
- •A.4 Methods to reduce skew
- •A.5 Methods to minimize the effects of delay and skew
- •A.6 Example SDRAM memory timing diagram
- •A.7 SDRAM memory timing paths
- •Troubleshooting
- •B.1 Troubleshooting
- •C.1 AHB register signals
- •C.2 AHB memory signals
- •C.3 Miscellaneous and clock signals
- •C.4 Pad interface and control signals
- •C.5 Test Interface Controller (TIC) signals
- •C.6 Scan test signals
MultiPort Memory Controller Signal Descriptions
C.4 Pad interface and control signals
Table C-4 describes the pad interface and control signals.
Table C-4 Pad interface and control signal descriptions
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Value on |
Value |
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Source/ |
during |
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Name |
Type |
reset |
Description |
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destination |
self- |
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(nPOR) |
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refresh |
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MPMCADDROUT[27:0] |
Output |
Pad |
0x0000000 |
Depends on |
Address output. Used for |
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static |
both static and SDRAM |
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memory |
devices.SDRAM memories |
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accesses |
use bits [14:0]. Static |
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memories use bits [25:0]. |
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MPMCCKEOUT[3:0] |
Output |
Pad |
0xF |
0x0 |
SDRAM clock enables. |
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Used for SDRAM devices. |
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MPMCCLKOUT[3:0] |
Output |
Pad |
Follows |
Follows |
SDRAM clocks. Used for |
|
SDRAM clock out |
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MPMCCLK |
MPMCCLK |
SDRAM devices. |
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MPMCDATAIN[31:0] |
Input |
Pad |
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Read data from memory. |
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Used for the static memory |
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controller, the dynamic |
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memory controller and the |
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TIC. |
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MPMCDATAOUT[31:0] |
Output |
Pad |
0x00000000 |
Depends on |
Data output to memory. |
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static |
Used for the static memory |
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memory |
controller, the dynamic |
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accesses |
memory controller and the |
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TIC. |
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MPMCDQMOUT[3:0] |
Output |
Pad |
0xF |
0xF |
Data mask output to |
|
SDRAM data mask |
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SDRAMs. Used for |
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SDRAM devices and static |
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memories. |
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MPMCFBCLKIN[3:0] |
Input |
Pad |
- |
- |
Fed-back clocks. Used for |
|
SDRAM fed-back clock in |
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SDRAM devices. |
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MPMCRPVHHOUT |
Output |
Pad |
0 |
- |
Voltage control for RP |
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output signal. |
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MPMCTESTIN |
Input |
Pad |
- |
- |
This is pin is used to place |
|
Test Mode |
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the MPMC into TIC test |
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mode. Used for TIC test. |
C-8 |
Copyright © 2002 ARM Limited. All rights reserved. |
ARM DDI 0215A |
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MultiPort Memory Controller Signal Descriptions |
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Table C-4 Pad interface and control signal descriptions (continued) |
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Value on |
Value |
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Source/ |
during |
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Name |
Type |
reset |
Description |
|||
destination |
self- |
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(nPOR) |
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refresh |
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nMPMCBLSOUT[3:0] |
Output |
Pad |
0xF |
Depends on |
Byte lane select, active |
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static |
LOW, for static memories. |
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memory |
Used for static memory |
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accesses |
devices. |
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nMPMCCASOUT |
Output |
Pad |
1 |
1 |
Column address strobe. |
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Used for SDRAM devices. |
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nMPMCDATAOUTEN[3:0] |
Output |
Pad control |
0xF |
0xF |
Tristate I/O pad output |
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enable for the byte lanes of |
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the external memory |
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databus |
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MPMCDATA[31:0], active |
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LOW. Enables the byte |
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lanes [31:24], [23:16], |
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[15:8], and [7:0] of the |
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databus independently. |
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Used for the static and |
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dynamic memory |
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controllers, and the TIC. |
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nMPMCDYCSOUT[3:0] |
Output |
Pad |
0xF |
0xF |
SDRAM chip selects. Used |
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for SDRAM devices. |
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nMPMCOEOUT |
Output |
Pad |
1 |
Depends on |
Output enable for static |
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static |
memories. Used for static |
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memory |
memory devices. |
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accesses |
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nMPMCRASOUT |
Output |
Pad |
1 |
1 |
Row address strobe. Used |
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for SDRAM devices. |
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nMPMCRPOUT |
Output |
Pad |
0 |
- |
Reset power down to |
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SyncFlash memory. Used |
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for the dynamic memory |
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controller. |
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nMPMCSTCSOUT[3:0] |
Output |
Pad |
0xF |
Depends on |
Static memory chip selects. |
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static |
Default active LOW. Used |
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memory |
for static memory devices. |
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|
accesses |
|
ARM DDI 0215A |
Copyright © 2002 ARM Limited. All rights reserved. |
C-9 |
MultiPort Memory Controller Signal Descriptions
Table C-4 Pad interface and control signal descriptions (continued)
|
|
|
Value on |
Value |
|
|
|
|
Source/ |
during |
|
||
Name |
Type |
reset |
Description |
|||
destination |
self- |
|||||
|
|
(nPOR) |
|
|||
|
|
|
refresh |
|
||
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|
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||
|
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nMPMCWEOUT |
Output |
Pad |
1 |
Depends on |
Write enable. Used for |
|
Write enable. During test |
|
|
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static |
SDRAM and static |
|
mode acts as test acknowledge |
|
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memory |
memories. |
|
signal |
|
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|
accesses |
|
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|
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This signal is used as test |
|||
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acknowledge |
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(MPMCTESTACK), |
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during TIC test mode.The |
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test bus acknowledge signal |
|
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gives external indication |
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that the test bus has been |
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granted and also indicates |
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when a test access has |
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completed. When |
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MPMCTESTACK is LOW |
|
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the current test vector must |
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be extended until |
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MPMCTESTACK |
|
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becomes HIGH. |
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MPMCTESTREQB |
Input |
Pad |
- |
- |
This pin is used in TIC test |
|
Test bus request B |
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|
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mode. During test this |
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signal is used, in |
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combination with |
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MPMCTESTREQA, to |
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indicate the type of test |
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vector that is applied in the |
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following cycle. The test |
|
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|
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bus acknowledge signal |
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gives external indication |
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that the test bus has been |
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granted and also indicates |
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|
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when a test access has |
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completed. When |
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MPMCTESTACK is |
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LOW, the current test vector |
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must be extended until |
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MPMCTESTACK |
|
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becomes HIGH. |
C-10 |
Copyright © 2002 ARM Limited. All rights reserved. |
ARM DDI 0215A |
|
|
|
|
MultiPort Memory Controller Signal Descriptions |
||
|
|
Table C-4 Pad interface and control signal descriptions (continued) |
||||
|
|
|
|
|
|
|
|
|
|
Value on |
Value |
|
|
|
|
Source/ |
during |
|
||
Name |
Type |
reset |
Description |
|||
destination |
self- |
|||||
|
|
(nPOR) |
|
|||
|
|
|
refresh |
|
||
|
|
|
|
|
||
|
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|
MPMCTESTREQA Test bus |
Input |
Pad |
- |
- |
This pin is used in TIC test |
|
request A |
|
|
|
|
mode. In test mode, this pin |
|
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|
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is the test bus request A |
|
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input signal and is required |
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as a dedicated device pin. |
During normal system operation the
MPMCTESTREQA signal is used to request entry into the test mode. During test
MPMCTESTREQA is used, in combination with
MPMCTESTREQB, to indicate the type of test vector that is applied in the following cycle.
ARM DDI 0215A |
Copyright © 2002 ARM Limited. All rights reserved. |
C-11 |