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ARM PrimeCell multiport memory controller technical reference manual.pdf
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System Connectivity

9.3Example system

This section shows an example system. The system illustrates the memory controller integration issues. See Figure 9-5 for a block diagram of the example system.

Misc pads

 

 

 

 

nRESET

 

Input

 

 

 

signals

 

 

 

 

 

Multiplexed

 

 

 

 

Input

 

 

 

input signals

 

signals

 

 

 

 

 

 

 

 

 

 

 

 

MPMCTESTIN

TestClock

Clock HCLK generator MPMCCLK

PMU

Reset control

Refresh

control

Clock select

ARM processor

DMA controller

DMA controller

LCD controller

nPOR

HRESETn

MPMCBIGENDIAN MPMCSTCS1MW[1:0]

MPMCSTCS0POL

MPMCSTCS1POL

MPMCSTCS2POL

MPMCSTCS3POL

MPMCSREFREQ

MPMCSREFACK

HCLK

MPMCCLK

AHB Bus3

AHB Bus2

AHB Bus1

AHB Bus0

MPMC

MPMCDATAOUTEN[1:0]

SDRAM pads

 

 

MPMCDATAOUT[15:0]

Bidirectional

 

 

 

MPMCDATA[15:0]

 

 

tristate

 

MPMCDATAIN[15:0]

 

 

signals

 

 

 

 

 

MPMCADDROUT[27:0]

 

MPMCADDROUT[27:0]

 

MPMCCKEOUT[3:0]

 

MPMCCKEOUT[3:0]

 

MPMCDQMOUT[3:0]

 

MPMCDQMOUT[3:0]

 

nMPMCCASOUT

 

nMPMCCASOUT

 

nMPMCRASOUT

 

nMPMCRASOUT

 

nMPMCDYCSOUT[3:0]

 

nMPMCDYCSOUT[3:0]

 

nMPMCWEOUT

Output

nMPMCWEOUT

 

nMPMCRPOUT

signals

nMPMCRPOUT

 

 

 

nMPMCOEOUT

 

nMPMCOEOUT

 

nMPMCBLSOUT[3:0]

 

nMPMCBLSOUT[3:0]

 

nMPMCSTCSOUT[3:0]

 

nMPMCSTCSOUT[3:0]

 

MPMCCLKOUT[3:0]

 

MPMCCLKOUT[3:0]

 

Delay

 

 

 

MPMCFBCLKIN[3:0]

 

MPMCFBCLKIN[3:0]

 

 

Input

 

 

MPMCTESTIN

signals

MPMCTESTIN

 

 

TICAHB

 

 

 

 

 

MUX pads

 

Register

MPMCDATAOUTEN[3:2]

 

 

AHB

MPMCDATAOUT[31:16]

 

 

 

Bidirectional

MPMCDATA[31:16]

 

 

 

 

tristate

 

MPMCDATAIN[31:16]

 

 

signals

 

Memory

 

 

 

 

 

AHB3

 

 

 

 

MPMCTESTREQB

 

MPMCTESTREQB

Memory

MPMCTESTREQA

Input

MPMCTESTREQA

AHB2

signals

 

 

Memory

 

 

 

AHB1

 

 

 

Memory

 

 

 

AHB0

 

 

 

Figure 9-5 Example system

9-10

Copyright © 2002 ARM Limited. All rights reserved.

ARM DDI 0215A

System Connectivity

9.3.1AHB bus 0

The highest priority MPMC AHB memory port, port 0, is connected to high priority, low latency peripheral, in this case a LCD controller.

9.3.2AHB bus 1

The next highest priority MPMC AHB memory port, port 1, is connected to the next highest priority peripheral, in this case a DMA controller.

9.3.3AHB bus 2

MPMC AHB memory port 2, is connected to a DMA controller.

9.3.4AHB bus 3

The AHB memory port (lowest priority), the AHB register port, and the AHB Tic port of the MPMC are all connected to AHB bus 3. The ARM processor is also connected to this bus. The ARM processor is therefore able to program the MPMC and to access external memory. The ARM processor can also be production tested using TIC test patterns.

Note

Some ARM processors use the TIC interface for production test.

9.3.5Power Management Unit

The major components of the Power Management Unit (PMU) are:

Reset controller

Refresh controller on page 9-12

Clock select on page 9-12.

Reset controller

The reset controller generates the power-on-reset, nPOR, and AMBA reset signal,

HRESETn.

The MPMCBIGENDIAN, MPMCSTCS1MW[1:0], and MPMCSTCS[3:0]POL signals are generated by registering the value of a number of inputs to the chip when the power-on reset goes inactive. These input signals are reused during normal operation.

ARM DDI 0215A

Copyright © 2002 ARM Limited. All rights reserved.

9-11

System Connectivity

Refresh controller

The refresh controller can place the SDRAM memory devices into self-refresh mode by using the MPMCSREFREQ and MPMCSREFACK signals.

Clock select

The clock select logic is used to select the various clocks. In TIC test mode, when MPMCTESTIN is HIGH, HCLK and MPMCCLK must operate at no more than 10MHz.

9.3.6MPMC off-chip signals

The MPMC off-chip signals are:

Functional mode signals

Test mode signals.

Functional mode signals

The system has a 16-bit external databus MPMCDATA[15:0].

MPMCDATAOUT[15:0] and MPMCDATAIN[15:0] are connected to bidirectional tristate pads. The direction of these pads is controlled by MPMCDATAEN[1:0].

It is recommended that you use clock pads, if available, for the clock signals

MPMCCLKOUT[3:0] and MPMCFBCLKIN[3:0].

The output signals, for example MPMCADDROUT[27:0], must be skew balanced with the databus. This can be performed by selecting appropriate pad cells. One possible way is to use the same bidirectional pads for the output signals as used for the data signals.

The input signals need not be skew balanced and so an appropriate input pad must be chosen.

Test mode signals

This example system requires the use of the TIC controller for ARM production test. The TIC controller requires a 32-bit databus, MPMCDATA[31:0], and three control signals, MPMCTESTREQA, MPMCTESTREQB and MPMCTESTACK.

MPMCTESTACK is multiplexed with the nMPMCWEOUT signal. The MPMCTESTREQA, MPMCTESTREQB and upper 16-bits of the databus, MPMCDATA[31:16], signals are required in test mode. To minimize the number of pads used these signals can be multiplexed with other signals.

9-12

Copyright © 2002 ARM Limited. All rights reserved.

ARM DDI 0215A