- •Contents
- •List of Tables
- •List of Figures
- •Preface
- •About this document
- •Feedback
- •Introduction
- •1.1 About the ARM PrimeCell MultiPort Memory Controller (PL172)
- •1.2 Supported dynamic memory devices
- •1.3 Supported static memory devices
- •Functional Overview
- •2.1 PrimeCell MPMC functional description
- •2.2 Overview of a PrimeCell MPMC, ASIC, or ASSP system
- •2.3 Low power operation
- •2.4 Lock and semaphores
- •2.5 Arbitration
- •2.6 Memory bank select
- •2.7 Memory map
- •Programmer’s Model
- •3.1 About the programmer’s model
- •3.2 Register descriptions
- •Programmer’s Model for Test
- •4.1 PrimeCell MPMC test harness overview
- •4.2 Scan testing
- •4.3 Test registers
- •Static Memory Controller
- •5.1 Static memory device selection
- •5.2 Write-protection
- •5.3 Extended wait transfers
- •5.4 Memory mapped peripherals
- •5.5 Static memory initialization
- •5.6 Byte lane control
- •5.7 Byte lane control and databus steering for little and big-endian configurations
- •Dynamic Memory Controller
- •6.1 Write-protection
- •6.2 Access sequencing and memory width
- •6.3 Address mapping
- •6.4 Dynamic memory controller command descriptions
- •6.5 Generic SDRAM initialization example
- •6.6 Micron MT48LC4M16A2 SDRAM initialization example
- •6.8 Micron MT28F4M16S2 SyncFlash initialization example
- •6.9 Micron SyncFlash commands
- •Common Memory Transactions
- •7.1 Static and dynamic memory transaction latency
- •Test Interface Controller
- •8.1 About TIC
- •8.2 Sequence of events leading to entry into TIC test mode
- •System Connectivity
- •9.2 Self-refresh entry
- •9.3 Example system
- •Off-chip Connectivity
- •10.2 Pin count reduction by reducing databus width
- •10.3 Pin count reduction by removing functionality
- •10.4 Address pin reduction
- •10.5 Chip select pin reduction
- •10.6 Device support
- •10.7 Multiplexing static and dynamic memory pins
- •10.8 Reducing pin count by multiplexing MPMC pins
- •10.9 About MPMC timing
- •10.10 On-chip timing path
- •10.11 Off-chip timing path
- •10.12 Clock strategy
- •10.13 Clock ratios
- •10.14 Memory clock and fed-back clock strategy
- •Pad Interface Timing
- •A.1 Overview
- •A.2 Signal delay
- •A.3 Method to reduce delay
- •A.4 Methods to reduce skew
- •A.5 Methods to minimize the effects of delay and skew
- •A.6 Example SDRAM memory timing diagram
- •A.7 SDRAM memory timing paths
- •Troubleshooting
- •B.1 Troubleshooting
- •C.1 AHB register signals
- •C.2 AHB memory signals
- •C.3 Miscellaneous and clock signals
- •C.4 Pad interface and control signals
- •C.5 Test Interface Controller (TIC) signals
- •C.6 Scan test signals
Chapter 10
Off-chip Connectivity
This chapter provides examples of how external memory can be connected to the MPMC. It contains the following sections:
•Off-chip signals on page 10-2
•Pin count reduction by reducing databus width on page 10-4
•Pin count reduction by removing functionality on page 10-5
•Address pin reduction on page 10-9
•Chip select pin reduction on page 10-10
•Device support on page 10-11
•Multiplexing static and dynamic memory pins on page 10-12
•Reducing pin count by multiplexing MPMC pins on page 10-13
•About MPMC timing on page 10-14
•On-chip timing path on page 10-15
•Off-chip timing path on page 10-16
•Clock strategy on page 10-17
•Clock ratios on page 10-18
•Memory clock and fed-back clock strategy on page 10-19.
ARM DDI 0215A |
Copyright © 2002 ARM Limited. All rights reserved. |
10-1 |
Off-chip Connectivity
10.1Off-chip signals
Table 10-1 shows the pins that are required to be bonded out. For a 32-bit wide external databus 86 pins are required, for a 16-bit external databus 70 pins are required.
Table 10-1 External pins
Pin name |
Static memory |
Dynamic memory |
TIC |
|
|
|
|
MPMCCLKOUT[3:0] |
N/A |
Clock out |
N/A |
SDRAM clock out |
|
|
|
|
|
|
|
MPMCFBCLKIN[3:0] |
N/A |
Clock in |
N/A |
SDRAM fed-back clock in |
|
|
|
|
|
|
|
nMPMCDYCSOUT[3:0] |
N/A |
Chip select |
N/A |
|
|
|
|
MPMCCKEOUT[3:0] |
N/A |
Clock enable |
N/A |
|
|
|
|
MPMCDQMOUT[3:0] |
N/A |
Byte select |
N/A |
|
|
|
|
nMPMCRASOUT |
N/A |
RAS strobe |
N/A |
|
|
|
|
nMPMCCASOUT |
N/A |
CAS strobe |
N/A |
|
|
|
|
nMPMCWEOUT |
Write enable |
Write enable |
MPMCTESTACK |
|
|
|
test acknowledge |
|
|
|
|
MPMCADDROUT[27:0] |
Address out |
Address out |
N/A |
|
|
|
|
MPMCDATA[31:0] |
Bidirectional data |
Bidirectional data |
Bidirectional data |
|
(MPMCDATA |
(MPMCDATA |
(MPMCDATA |
|
OUT[31:0]/ |
OUT[31:0]/ |
OUT[31:0]/ |
|
MPMCDATA |
MPMCDATA |
MPMCDATA |
|
IN[31:0]) |
IN[31:0]) |
IN[31:0]) |
|
|
|
|
nMPMCRPOUT |
N/A |
Micron SyncFlash |
N/A |
|
|
reset power down |
|
|
|
|
|
nMPMCSTCSOUT[3:0] |
Chip select |
N/A |
N/A |
|
|
|
|
nMPMCOEOUT |
Output enable |
N/A |
N/A |
|
|
|
|
MPMCTESTIN Test mode |
N/A |
N/A |
TIC test mode select |
|
|
|
|
nMPMCBLSOUT[3:0] |
Byte select |
N/A |
N/A |
|
|
|
|
The signals in Table 10-2 on page 10-3 might also have to be bonded out. Some of the signals can be multiplexed.
10-2 |
Copyright © 2002 ARM Limited. All rights reserved. |
ARM DDI 0215A |
Off-chip Connectivity
The MPMCTESTREQA and MPMCTESTREQB signals are only required in TIC test mode and can therefore be multiplexed with other signals.
The MPMCRPVHHOUT signal is only required to be bonded out if:
•Micron SyncFlash support is required,
•high voltage VHH nRP support is required and,
•the high voltage generator is not on the chip.
.
Table 10-2 Multiplexed pins
Pin name |
Static memory |
Dynamic memory |
TIC |
|
|
|
|
MPMCRPVHHOUT |
N/A |
Micron SyncFlash |
N/A |
|
|
reset voltage indicator |
|
|
|
|
|
MPMCTESTREQA |
N/A |
N/A |
Test request A |
|
|
|
|
MPMCTESTREQB |
N/A |
N/A |
Test request B |
|
|
|
|
ARM DDI 0215A |
Copyright © 2002 ARM Limited. All rights reserved. |
10-3 |
Off-chip Connectivity
10.2Pin count reduction by reducing databus width
The databus width can be reduced from 32 bits to 16 bits. Using a HCLK to MPMCCLK ratio of 1:1, with a 16-bit bus impacts performance. Using a MPMCCLK that is twice the frequency of HCLK, with a 16-bit bus, provides similar performance to a design with a 32-bit databus.
10-4 |
Copyright © 2002 ARM Limited. All rights reserved. |
ARM DDI 0215A |